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: 118 Real Questions

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PON products from Cortina for 10G EPON and EPON/GPON markets | real questions and Pass4sure dumps

Date: 31-05-12

Cortina Systems, Inc. has announced a family of PON products CS8124 quad 10G EPON OLT with integrated advance traffic management, CS8160 10G EPON ONU for MDU deployments, and CS8232 dual mode EPON/GPON ONU with home gateway capabilities. These parts target the growing segments of the PON spectrum.

Cortina claims, for the central office, the CS8124 10G EPON OLT is the industry's first high density 10G EPON OLT driving innovation for line card designs with support for the latest SIEPON and DPoE standards.

For MDU applications, Cortina CS8160 10G EPON ONU SoC device has good architecture optimized for high-density subscriber traffic management. For fiber to the home gateway, Cortina CS8232 Dual Mode EPON/GPON ONU has Cortina Packet Express architecture with flexibility allowing it to be configured as a full feature, high-end ONU or a cost effective low-end ONU.

CS8124: Quad 10G EPON OLTThe Cortina CS8124 10G EPON OLT is the quad 10G EPON OLT to address service providers' need for volume deployment of high density 10G EPON systems. CS8124 integrates 4 ports of 10G EPON MACs, SerDes and IEEE P1904.1 SIEPON-compliant power saving engine into a low-power device. The CS8124 also features an advanced traffic management core, based on Cortina CS8022 1G EPON OLT.

Four symmetric and asymmetric 10G EPON OLT portsIntegrated traffic management with full L2 switch and VLAN processingSupport for DPoE specifications, featuring 2048 LLIDs per PON port - Offers North America MSOs migrating to EPON technology flexibility in their deploymentSupport for IEEE1588v2, IEEE802.1AS, and 1PPS+ToD timing synchronization - enables wireless mobile backhaul in 4G LTE networks

CS8160: 10G EPON ONUThe Cortina CS8160 10G EPON ONU, together with the CS8124, provides system vendors a complete end-to-end 10G EPON solution. The architecture features XAUI and four SGMII ports for MDU configurations. With an integrated traffic management engine supporting up to 256 subscribers, the CS8160 also gives network operators maximum control in managing and provisioning traffic from their customers. Coupled with the CS8124, the CS8160 supports SIEPON-compliant sleep modes.

10G EPON ONU supporting 2048 queues and 256 subscribers - Optimized for MDU deploymentCompliant to DPoE specifications, including multiple LLIDs - Support for North America MSOs migrating to EPON technologySupport for IEEE1588v2, IEEE802.1AS and 1PPS+ToD timing synchronization - Enables wireless mobile backhaul in 4G LTE networks

CS8232: Dual Mode EPON/GPON ONUThe Cortina CS8232 dual mode EPON/GPON ONU single chip architecture allows it to be configured as a full feature home gateway ONU or a bridging ONU enabling system vendors to maximize their resources by designing one solution for the entire market. The Cortina CS8232 dual mode EPON/GPON ONU can be optimized for operating cost savings with power saving and OAM (operation, administration, and maintenance) features. The CS8232 lowers service provider operating cost with remote diagnostic capabilities.

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Prediction of Strong Dichroism Induced by X Rays Carrying Orbital Momentum | real questions and Pass4sure dumps


  


hEcore (eV)
















Eyz/zxExy=1.0 (eV) Ru




   

Integrated intensity


Exy (eV)




yz/zx xy





yz/zx xy yz/zx xy

(a) (b)


FIG. 3: (color online) (a) OAM x-ray dichroism for ruthen-

ates calculated for a RuO6cluster, see (b), for a splitting of

the t2gorbitals given by Eyz/zx −Exy as given in the Figure.

(c) The integrated intensity of the spectrum as a function

of Eyz/zx −Exy . The solid line (blue, solid) gives the total

integrated intensity for an incoming polarization vector ˆ


and ˆ

e−1(purple, dotted). The curves indicated t2g(red) and

eg(green) give the integrated intensities for the low-energy

states (<2 eV) and the high-energy states (>2 eV), respec-

tively, only OAM for ˆ

e1is shown. The dotted part indicates

the region where the low- and high-energy states are difficult

to separate.

to the large crystal-field splitting, they can often clearly

separate the excitations into the xy orbitals (<2 eV)

and the egorbitals (>2 eV). Figure 3(c) shows the inte-

grated intensities as a function of Eyz/zx −Exy . They see

a decrease of the total intensity, see Fig. 3(c). By sepa-

rating the integrated intensity into low- and high-energy

regions, they see that the change in intensity is mainly

a result of the decrease in intensity in the low-energy

region related to 1s→xy excitations. They can distin-

guish three plateaus, corresponding to ground states with

predominantly yz↑yz↓zx↑zx↓(2 xy holes, with an inte-

grated intensity of 2

15 ), yz↑zx↑(yz/zx)↓xy↑(1 xy hole),

and (yz/zx)↑(yz/zx)↓xy↑xy↓(no xy holes) character,

see Fig. 3(b). The integrated intensity basically follows

the xy hole density. The transitions between the different

ground states is smooth due to the 4dspin-orbit coupling.

−Conclusions. They have shown the possibility of per-

forming quadrupolar x-ray dichroism experiments using

x-rays carrying orbital angular momentum. Taking the

difference between negative and positive OAM states re-

moves the OAM-independent electric multipole transi-

tions and dipolar transitions related to the off-axis posi-

tion of the beam. The signal of the quadrupolar OAM-

induced signal can be enhanced with respect to the other

contributions by the use of x-ray OAM beams approach-

ing the scale of atomic orbital dimensions. Diffractive

optics for focusing intense coherent x-ray beams to the

nanometer scale have been demonstrated [9], and focus-

ing singular x-ray optics along similar principles are feasi-

ble [18]. OAM-induced x-ray dichroism provides a unique

way to study the electron-addition states close to the

Fermi level in the absence of core-hole spin-orbit split-

ting and strong core-valence multiplet interactions. In

particular, the spectral line shape is very sensitive to

changes in orbital occupancies, such as in-plane/out-of-

plane redistributions of electron densities. Finally, we

suggest that this approach might be applied to study

x-ray OAM-induced dichroism effects in resonant x-ray

scattering experiments.

Discussions with Andreas Menzel and Serkan Erdin are

acknowledged. This work was supported by the U.S. De-

partment of Energy (DOE), DE-FG02-03ER46097, and

NIU’s Institute for Nanoscience, Engineering, and Tech-

nology under a grant from the U.S. Department of Edu-

cation. Work at Argonne National Laboratory was sup-

ported by the U.S. DOE, Office of Science, Office of Basic

Energy Sciences, under contract DE-AC02-06CH11357.

[1] L. Allen et al., Phys. Rev. A 45, 8185 (1992).

[2] For a review, see D. G. Grier, Nature 424, 810 (2003).

[3] J. H. Lee, G. Foo, E. G. Johnson, and G. A. Swartzlan-

der, Jr. Phys. Rev. Lett. 97, 053901 (2006).

[4] M. Babiker et al., Phys. Rev. Lett. 89, 143601 (2002).

[5] A. Alexandrescu, E. Di Fabrizio, and D. Cojoc, J. Opt.

B: Quantum Semiclass. Opt. 7, 87 (2005).

[6] A. Alexandrescu, D. Cojoc, and E. Di Fabrizio, Phys.

Rev. Lett. 96, 243001 (2006).

[7] A. G. Peele et al., Opt. Lett. 27, 1752 (2002); A. G. Peele

et al., J. Opt. Soc. Am. A 21, 1575 (2004).

[8] I. McNulty, S. Rehbein, S. Eisebitt, A. Menzel, C.

G¨unther, and F. Senf, Appl. Phys. Lett., in press.

[9] W. Chao et al., Nature 435, 1210 (2005); H. C. Kang et

al., Phys. Rev. Lett. 96, 127401 (2006).

[10] C. T. Chen et al., Phys. Rev. Lett. 68, 2543 (1992).

[11] B. T. Thole, P. Carra, F. Sette, and G. van der Laan,

Phys. Rev. Lett. 68, 1943 (1992); P. Carra, B. T. Thole,

M. Altarelli, and X. Wang, ibid. 70, 694 (1993).

[12] For a review, see M. B. Salamon and M. Jaime, Rev.

Mod. Phys. 73, 583 (2001).

[13] C. Zener, Phys. Rev. 82, 403 (1951); P. W. Anderson

and H. Hasegawa, Phys. Rev. 100, 675 (1955).

[14] A. J. Millis, P. B. Littlewood, and B. I. Shraiman, Phys.

Rev. Lett. 74, 5144 (1995).

[15] D. J. Huang et al., Phys. Rev. Lett. 92, 087202 (2004).

[16] R. D. Cowan, The Theory of Atomic Spectra (University

of California Press, Berkeley, 1981).

[17] T. Mizokawa et al., Phys. Rev. Lett. 87, 077202 (2001).

[18] D. Cojoc et al., Microelectronic Engineering 83, 1360

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ISC2 [6 Certification Exam(s) ]
ISEB [24 Certification Exam(s) ]
Isilon [4 Certification Exam(s) ]
ISM [6 Certification Exam(s) ]
iSQI [7 Certification Exam(s) ]
ITEC [1 Certification Exam(s) ]
Juniper [65 Certification Exam(s) ]
LEED [1 Certification Exam(s) ]
Legato [5 Certification Exam(s) ]
Liferay [1 Certification Exam(s) ]
Logical-Operations [1 Certification Exam(s) ]
Lotus [66 Certification Exam(s) ]
LPI [24 Certification Exam(s) ]
LSI [3 Certification Exam(s) ]
Magento [3 Certification Exam(s) ]
Maintenance [2 Certification Exam(s) ]
McAfee [8 Certification Exam(s) ]
McData [3 Certification Exam(s) ]
Medical [69 Certification Exam(s) ]
Microsoft [375 Certification Exam(s) ]
Mile2 [3 Certification Exam(s) ]
Military [1 Certification Exam(s) ]
Misc [1 Certification Exam(s) ]
Motorola [7 Certification Exam(s) ]
mySQL [4 Certification Exam(s) ]
NBSTSA [1 Certification Exam(s) ]
NCEES [2 Certification Exam(s) ]
NCIDQ [1 Certification Exam(s) ]
NCLEX [2 Certification Exam(s) ]
Network-General [12 Certification Exam(s) ]
NetworkAppliance [39 Certification Exam(s) ]
NI [1 Certification Exam(s) ]
NIELIT [1 Certification Exam(s) ]
Nokia [6 Certification Exam(s) ]
Nortel [130 Certification Exam(s) ]
Novell [37 Certification Exam(s) ]
OMG [10 Certification Exam(s) ]
Oracle [282 Certification Exam(s) ]
P&C [2 Certification Exam(s) ]
Palo-Alto [4 Certification Exam(s) ]
PARCC [1 Certification Exam(s) ]
PayPal [1 Certification Exam(s) ]
Pegasystems [12 Certification Exam(s) ]
PEOPLECERT [4 Certification Exam(s) ]
PMI [15 Certification Exam(s) ]
Polycom [2 Certification Exam(s) ]
PostgreSQL-CE [1 Certification Exam(s) ]
Prince2 [6 Certification Exam(s) ]
PRMIA [1 Certification Exam(s) ]
PsychCorp [1 Certification Exam(s) ]
PTCB [2 Certification Exam(s) ]
QAI [1 Certification Exam(s) ]
QlikView [1 Certification Exam(s) ]
Quality-Assurance [7 Certification Exam(s) ]
RACC [1 Certification Exam(s) ]
Real-Estate [1 Certification Exam(s) ]
RedHat [8 Certification Exam(s) ]
RES [5 Certification Exam(s) ]
Riverbed [8 Certification Exam(s) ]
RSA [15 Certification Exam(s) ]
Sair [8 Certification Exam(s) ]
Salesforce [5 Certification Exam(s) ]
SANS [1 Certification Exam(s) ]
SAP [98 Certification Exam(s) ]
SASInstitute [15 Certification Exam(s) ]
SAT [1 Certification Exam(s) ]
SCO [10 Certification Exam(s) ]
SCP [6 Certification Exam(s) ]
SDI [3 Certification Exam(s) ]
See-Beyond [1 Certification Exam(s) ]
Siemens [1 Certification Exam(s) ]
Snia [7 Certification Exam(s) ]
SOA [15 Certification Exam(s) ]
Social-Work-Board [4 Certification Exam(s) ]
SpringSource [1 Certification Exam(s) ]
SUN [63 Certification Exam(s) ]
SUSE [1 Certification Exam(s) ]
Sybase [17 Certification Exam(s) ]
Symantec [135 Certification Exam(s) ]
Teacher-Certification [4 Certification Exam(s) ]
The-Open-Group [8 Certification Exam(s) ]
TIA [3 Certification Exam(s) ]
Tibco [18 Certification Exam(s) ]
Trainers [3 Certification Exam(s) ]
Trend [1 Certification Exam(s) ]
TruSecure [1 Certification Exam(s) ]
USMLE [1 Certification Exam(s) ]
VCE [6 Certification Exam(s) ]
Veeam [2 Certification Exam(s) ]
Veritas [33 Certification Exam(s) ]
Vmware [58 Certification Exam(s) ]
Wonderlic [2 Certification Exam(s) ]
Worldatwork [2 Certification Exam(s) ]
XML-Master [3 Certification Exam(s) ]
Zend [6 Certification Exam(s) ]

References : : :

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